Sagittal focusing monochromatizing principle about beam is based on Bragg law (2dsinθ=nλ) and the monochromic beam is obtained by changing Bragg angle θ.
光束弧矢聚焦单色化原理是指以Bragg定律(2dsinθ=nλ)为基础，改变Bragg角θ，获得所需的波长λ来实现光束的单色化。
Measurement of single-fiber Bragg grating includes packaging materials with different polymer single fiber Bragg grating method, using different combinations of the FBG and pre-strain law.
单光纤光栅测量主要包括用不同聚合物材料封装单光纤光栅法、利用不同的FBG组合和预制应变法等。
This phenomenon coincides with Bragg equation and the law of refraction.
这一现象与布拉格方程和折射定律所得结果一致。
Based on the Bragg's law, the ordered TiO2 inverse opal films were successfully used as refractive index sensors with a resolution of0.01.
用这种二氧化钛反蛋白石光子晶体膜对溶液折射率的检测实验表明该传感膜分辨率可达0.01。
Following, the English physicists - Braggs'obtained a simpler equation - the Bragg's law to show the relation of diffraction and made it easier to be accepted.
紧接着，英国物理学家布拉格父子又将此衍射关系用简单的布拉格定律表示，使之易于接受。
It is revealed the law of defect mode frequency varying with the defect layer thickness in the RHM-LHM Bragg cavity, different from the law in the RHM-RHM Bragg cavity.
发现了RHM-LHMBragg腔缺陷模频率随缺陷层厚度变化的规律，这不同于RHM-RHMBragg腔缺陷模的变化规律；
The spheres diameters correlated directly with the photonic bands position, according with the Bragg's law.
微球粒径的大小在光谱中表现为带隙中心位置的不同，且符合Bragg公式。
Based onthis Bragg's law and theory of optical thin film, the formula introduced in this chapter havebeen illustrated are useful for deducing the thickness of the ultra-thin layer.
论文第四章讨论了多层膜的小角x射线衍射谱的理论分析方法，导出了在超薄膜下进行厚度测量的十分有意义的单层膜厚度测量方法。
The total film thickness andsuperlattice'period were calculated by a modified Bragg law, in good agreement withthe results of computer simulation.
用修正的Bragg公式计算BTO/STO超晶格的周期数和总膜厚，理论和实验符合的十分好。
A modified Bragg law and three corresponding inference formulae forstraightforward determining the film thickness were derived based on geometricaloptical theory.
由几何光学方法推导了修正Bragg公式以及几个实用的推论公式，并对于金属多层膜反射率曲线中经常观察到的宽调制振荡给出了新的解释。
A quantitative analysis using computer simulation based on the modified Bragg's law and the optical multilayer theory was used to reproduce the diffraction rocking curves which fitted very well with the experimental ones, and a method to measure the structural parameters of Ge〓Si〓/Si superlattices was set up.
用光学多层膜理论对谱线作计算模拟的结果和实验非常一致，并在此基础上建立了一套同小角衍射测量Ge〓Si〓/Si超晶格结构参数的方法。
Analysing with X ray kinematics theory we obtained two diffraction conditions, corresponding to the grating equation and Bragg law respectively. The efficiencies of grating were found to be modulated by the multilayer reflection.
用X射线运动学理论进行了理论分析，得到两个衍射条件，分别对应于决定衍射角的光栅方程和决定多层膜峰值的布拉格定理，发现光栅级效率受多层膜反射调制。
The camera length of electron diffraction in transmisson electron microscopy is one of the main technical parameters in designing electron microscope and the electron diffraction analysis to microcrystal sample. According to Bragg law, the formula of calculating TEM electron diffraction camera length is derived from the research on the ray path of electron diffraction images in TEM and the comparison on electron diffraction with ordinary electronic diffractometer. The difference of physical significance of electron diffraction camera length between TEM and ordinary electronic diffractometer is discussed.
透射式电子显微镜(Transmisson Electron Microcopy，TEM)中的电子衍射相机长度，是电子显微镜设计和对微晶体样品进行电子衍射分析的主要技术参数之一依据布拉格定律，经对TEM中电子衍射成像光路的探讨与研究，并通过TEM与普通电子衍射仪的电子衍射的对比分析，导出了TEM电子衍射相机长度的精确计算公式，阐述了TEM和普通电子衍射仪的电子衍射相机长度所表征的物理意义的区别。