The electron wavelength was measured by analyzing the Kikuchi Lines from acon single crystal in four different ways.
本文用硅单晶片作标样，对摄得的菊池线用四种方法处理以测定实际的电子波长。
The strain sensitive parameters as Image qualities (IQ), the Hough transforms of the Kikuchi lines, as well as the small angle misorientation were used to evaluate the lattice distortion and the local elastic strain fields of the single crystals system at micron to submicron regions.
将菊池图的图像质量（IQ）和Hough转变强度，以及小角度晶界错配的统计数据作为应力敏感参数，研究了单晶材料系统中，微米~亚微米尺度的晶格畸变状态及局域弹性应变场。
A practical example of measuring the electron wave length using Kikuchi lines
用菊池线法测量入射电子波长的实例
Determination of misorientation between subgrains in a microalloy steel by using Kikuchi lines in CBED patterns
用会聚束电子衍射中菊池线测定微合金钢中亚晶取向差
Computer Simulation of Higher-Order Laue Zone Lines and Kikuchi Line Patterns of the Cubic Quasicrystal
立方准晶的高阶劳厄带线和菊池线花样的计算机模拟