In this paper, we have described the X-ray divergent beam technique, i. e. the production of Kossel lines and their applications to the deter-mination of the orientation of single crystals and to the precision measure-ment of lattice parameters.
本文介绍了X射线发散束Kossel线的产生及其在单晶定向和点阵参数测定方面的应用。
It is applied to a arbitrarily orientation Kossel pattern of a Fe-0.76wt % V-0.08wt % N alloy. The accuracy of the lattice parameter determination reaches 5 × 10 (- 5) A.