Describes Automatic Test Patterm Generation techniques which include Boolean Difference, D-Algorithm, PODEM (Path-Oriented Decision-Marking), FAN(Fanout-Oriented Test Generation) and Critical Path.
叙述自动测试图型生成技术,包含布尔差分法、D演算法、PODEM、FAN、临界通路等方法。
The Study of D-Algorithm for Trouble Test Generation in Combinational Circuit
组合电路的故障测试生成D算法研究
Research on the key technologies in an improved D-algorithm test generation
一种改进D算法测试生成的关键技术研究
The method is different from fault-list method, Boolean-difference method and D-algorithm.